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44th Design Automation Conference 27-03-07



Source: DAC

The Design Automation Conference (DAC), the electronic design automation (EDA) event, released the complete technical program for the 44th DAC, to be held June 4 – 8, 2007 at the San Diego Convention Center in San Diego. This year’s technical program features 161 papers selected out of 713 submissions, and is supplemented by eight special sessions, seven full-day tutorials, eight panels, 18 pavilion panels, and seven hands-on tutorials.

 

The technical breadth of the program will offer insights and information on the latest advances in EDA for the approximately 11,000 attendees that visit DAC each year including academics, researchers, developers, designers, managers, and executives in EDA, chip, and electronics companies. The complete program is now available on the DAC Web site. This year's conference features an automotive electronics theme which will be seen in special presentations and sessions throughout the week. Automotive electronics will be the focus of an all-day track on Wednesday, June 6, including a special session, invited talks, a panel, and regular papers all providing an opportunity for attendees to hear from EDA, semiconductor and automotive industry representatives about the issues impacting automotive design.

 

For example, a special session will feature presentations on aspects of defining, designing and using virtual automotive platforms to implement applications on shared hardware. In a pavilion panel that afternoon, presenters will explore the special needs for correctness and reliability in automotive software, and how car makers and the research community are meeting those requirements.

 

The program includes more than 53 technical sessions divided into 10 tracks: Analog/Mixed-Signal/RF and Simulation; Automotive Electronics; Business; DFM and the Manufacturing Interface; Interconnect and Reliability; Low Power Design; New and Emerging Technologies; Physical Design, Synthesis and FPGA; System Level and Embedded Design; and Verification and Test.

 
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