With "Parallel Test Technology: The New Paradigm for Parametric Testing", Keithley has presented a handbook on parametric tests of semiconductors. The 60 Page book provides information on

• the basics of parametric tests
• the implementation of parallel tests
• the utilization of parallel parametric tests with existing hardware solutions
• the development of test structures for parallel tests
• examples of programming code for typical parallel tests with pt_executable
• terminology (glossary)

According to Keithley, the information is meant to assist semiconductor fabs to achieve maximum test throughput at low test costs. The manual can be obtained free of charge.