Keithley Instruments will broadcast a free, web-based seminar titled “Phase Change Memory: Fundamentals and Measurement Techniques” on Thursday, February 25, 2010. This informative one-hour seminar will teach techniques for measuring and characterizing Phase Change Memory devices. This event will be broadcast at 15:00 CET for the convenience of the European audience.

Phase Change Memory, a type of non-volatile computer memory also known as PRAM, PCM, and PCRAM, is a new and promising technology. PRAM uses the unique behaviour of chalcogenide glass, which can be switched between two states, crystalline and amorphous, with the application of heat. Recent versions can achieve two additional distinct states, effectively doubling its storage capacity.

The webinar will provide basic information on the physics and operation of PRAM memory elements. Common characterization and measurement techniques will be described and compared, including the R-Load method and a technique using Keithley’s ultra fast IV unit. Primarily recommended for test engineers and test engineering managers who are new to making PRAM measurements, the webinar will also be useful for more experienced users.

The live broadcast is accompanied by an interactive Q&A which gives attendees the opportunity to ask the presenter for additional insight on this important topic. Alex Pronin, lead applications engineer with Keithley, will be presenting the seminar. Alex holds a Master’s Degree in Physics from the Moscow Institute of Physics and Technology and a Ph.D. in Material Science from Dartmouth.

The event is free to the public, but participants must register in advance.