Keithley will broadcast a free, web-based seminar titled “Fundamentals of Ultra-Fast I-V Device Characterization” on Thursday, April 29, 2010. This one-hour seminar will explore the increasing importance of Ultra-Fast Current-Voltage (I-V) characterization across a broad spectrum of device and process technologies.

Ultra-Fast Current-Voltage (I-V) testing, which includes pulsed I-V, transient I-V, and pulsed sourcing testing, is of increasing importance in the development of new semiconductor materials, processes, and devices. Common applications include non-volatile memory devices (NVM) such as Flash and phase change memory, isothermal characterization on silicon-on-insulator (SOI) devices and compound semiconductors, and transient characteristics of new materials such as high-K dielectrics.

This seminar is recommended for students, researchers, and engineers involved in the characterization of materials, processes, and devices. It will also be useful for lab managers wanting to learn about this measurement technique and engineers doing device and material reliability studies (WLR, ESD, latchup, etc.).

About the presenter

“Fundamentals of Ultra-Fast I-V Device Characterization” will be presented by Lee Stauffer, Senior Staff Technologist for Keithley Instruments’ Semiconductor Measurements Group based in Cleveland, Ohio. Prior to joining Keithley, Stauffer’s career included designing satellite communication systems, as well as equipment and product engineering in semiconductor fabs.

Registration information

“Fundamentals of Ultra-Fast I-V Device Characterization” will be broadcast on Thursday, April 29, 2010 at 15:00 CEST (1 p.m. GMT). The event is free to the public, but participants must register in advance.