Teradyne announced an agreement with JTAG Technologies to sell and distribute their Symphony/TS boundary scan product. The solution, designed specifically for Teradyne by JTAG Technologies, provides an boundary scan test option for manufacturers using Teradyne's TestStationT and legacy GR228X family of In-Circuit Test systems.

For production test flexibility, two implementations of Symphony are supported by this collaboration. Symphony/TS/CFM incorporates JTAG Technologies' boundary scan controller and TAP Interface Modules inside Teradyne's test system (using Teradyne's flexible Custom Function Board).

Symphony/TS/DSM uses a software converter to translate boundary scan test vectors (generated using JTAG Technologies' ProVision development software) directly to Teradyne's native test programming language where they can be applied efficiently using Teradyne's digital subsystem and innovative Deep Serial Memory option.